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A Virtual Metrology system for predicting CVD thickness with equipment variables and qualitative clustering. Abstract: In semiconductor manufacturing plants. Portable metrology system. It allows you to scan and to capture point clouds of your real pieces, in a versatile, agile and powerful way. The system uses white light interference measurement technique to perform nondestructive and rapid surface profile measurement and analysis, which is suitable.

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PDF | A metrology system designed and built for the NuSTAR mission is described. The NuSTAR mission is an orbiting X-ray telescope with a 10 meter focal. measurement system, any of the systems used in the process of associating numbers with physical quantities and phenomena. Although the concept of weights. Etch, CD-SEM and Defect Inspection Systems. Design Based Metrology System. Introducing the product lineup of design based metrology system.